Draft
International Standard
ISO/DIS 16666
Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements
Reference number
ISO/DIS 16666
Edition 1
© ISO 2024
Draft International Standard
Under development
This Draft International Standard is in the enquiry phase with ISO members.

Abstract

This document specifies terms and definitions for analytical methods where elements are identified and their concentrations determined by measuring X ray fluorescence radiation. The aim of this document is to establish terms and definitions for TXRF and to match these with terms and definitions relating to X ray fluorescence analysis.

General information

  • Status
     : Under development
    Stage
    : DIS registered [40.00]
  • Edition
     : 1
    Number of pages
     : 24
  • Technical Committee :
    ISO/TC 201/SC 10
    ICS :
    71.040.40 
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