Abstract
This document specifies procedures for the measurement of dislocation density in thin metals by using transmission electron microscope. This document applies to measure the dislocation density lower than 11015m-2. This document applies to analyse the dislocations in a single grain of the thin metals’ specimen with the thickness between tens to hundreds of nanometers.
General information
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Status: Under developmentStage: New project registered in TC/SC work programme [20.00]
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Edition: 1
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Technical Committee :ISO/TC 202/SC 3
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