This standard was last reviewed and confirmed in 2023.
Therefore this version remains current.
Abstract
PreviewThis document describes methods of measuring temperature and injected current dependence of lasing wavelengths, and lasing spectral line width in relation to semiconductor lasers for sensing applications.
This document is applicable to all kinds of semiconductor lasers, such as edge-emitting type and vertical cavity surface emitting type lasers, bulk-type and (strained) quantum well lasers, and quantum cascade lasers, used for optical sensing in e.g. industrial, medical and agricultural fields.
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Status: PublishedPublication date: 2018-05
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Edition: 1Number of pages: 29
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- ICS :
- 31.260 Optoelectronics. Laser equipment
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| Format | Language | |
|---|---|---|
| std 1 145 | PDF + ePub | |
| std 2 145 | Paper |
- CHF145
Life cycle
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Previously
WithdrawnISO/TS 17915:2013
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Now
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