Фильтр :
Стандарт и/или проект | Этап | ТК |
---|---|---|
Optics and photonics — Test method for temperature coefficient of refractive index of optical glasses — Part 1: Minimum deviation method
|
90.92 | ISO/TC 172/SC 3 |
Optics and photonics — Test method for temperature coefficient of refractive index of optical glasses — Part 1: Minimum deviation method
|
30.99 | ISO/TC 172/SC 3 |
Optics and photonics — Test method for temperature coefficient of refractive index of optical glasses — Part 2: Interferometric method
|
60.60 | ISO/TC 172/SC 3 |
Optics and optical instruments — Microscopes — Part 1: Immersion oil for general use in light microscopy
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Part 1: Immersion oil for general use in light microscopy
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Microscopes — Immersion liquids for light microscopy
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Immersion liquids for light microscopy
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Slides — Part 1: Dimensions, optical properties and marking
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Slides — Part 2: Quality of material, standards of finish and mode of packaging
|
90.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Slides — Part 2: Quality of material, standards of finish and mode of packaging — Technical Corrigendum 1
|
60.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Screw threads for objectives and related nosepieces — Part 1: Screw thread type RMS (4/5 in x 1/36 in)
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Screw threads for microscope objectives and related nosepieces — Part 2: Screw thread type M25 X 0,75 mm
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Screw thread for objectives
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Screw threads for objectives and related nosepieces
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Screw threads for objectives and related nosepieces
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Magnification
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Values, tolerances and symbols for magnification
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Values, tolerances and symbols for magnification
|
90.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Connecting dimensions of tube slides and tube slots
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Dimensions of tube slide and tube slot connections
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Optical materials and components — Specification of chalcogenide glass used in the infrared spectrum
|
60.60 | ISO/TC 172/SC 3 |
Optics and optical instruments — Microscopes — Cover glasses — Part 1: Dimensional tolerances, thickness and optical properties
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Cover glasses — Part 1: Dimensional tolerances, thickness and optical properties
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Cover glasses — Part 1: Dimensional tolerances, thickness and optical properties
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Cover glasses — Part 2: Quality of materials, standards of finish and mode of packaging
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Cover glasses — Part 2: Quality of materials, standards of finish and mode of packaging
|
90.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Reference system of polarized light microscopy
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Spectral filters
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Marking of objectives and eyepieces
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Marking of objectives and eyepieces — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Marking of objectives and eyepieces
|
90.60 | ISO/TC 172/SC 5 |
Endoscopes — Medical endoscopes and endotherapy devices — Part 1: General requirements
|
40.60 | ISO/TC 172/SC 5 |
Optics and photonics — Medical endoscopes and endotherapy devices — Part 5: Determination of optical resolution of rigid endoscopes with optics
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Medical endoscopes and endotherapy devices — Part 5: Determination of optical resolution of rigid endoscopes with optics
|
60.60 | ISO/TC 172/SC 5 |
Optics and photonics — Medical endoscopes and endotherapy devices — Part 6: Vocabulary
|
95.99 | ISO/TC 172/SC 5 |
Endoscopes — Medical endoscopes and endotherapy devices — Part 6: Vocabulary
|
60.60 | ISO/TC 172/SC 5 |
Endoscopes — Medical endoscopes and endotherapy devices — Part 8: Particular requirements for capsule endoscopes
|
60.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Environmental test methods — Part 1: Definitions, extent of testing
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 1: Definitions, extent of testing
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 1: Definitions, extent of testing
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 2: Cold, heat, humidity
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 2: Cold, heat and humidity
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 2: Cold, heat and humidity
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 2: Cold, heat and humidity — Amendment 1
|
60.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 3: Mechanical stress
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 3: Mechanical stress
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 3: Mechanical stress
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 3: Mechanical stress — Amendment 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 3: Mechanical stress
|
60.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 4: Salt mist
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 4: Salt mist
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 4: Salt mist
|
90.60 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 4: Salt mist — Amendment 1
|
60.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 5: Combined cold, low air pressure
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 6: Dust
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 6: Dust
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 7: Drip, rain
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 7: Drip, rain — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 7: Resistance to drip or rain
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 7: Resistance to drip or rain
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 8: High pressure, low pressure, immersion
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 8: High internal pressure, low internal pressure, immersion
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 9: Solar radiation
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 9: Solar radiation and weathering
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 10: Combined sinusoidal vibration, dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 10: Combined sinusoidal vibration and dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 11: Mould growth
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 11: Mould growth
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 12: Contamination
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 12: Contamination
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 13: Combined shock, bump or free fall, dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 13: Combined shock, bump or free fall and dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 14: Dew, hoarfrost, ice
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 14: Dew, hoarfrost, ice
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 15: Combined random vibration wide band: reproducibility medium, in dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 15: Combined digitally controlled broad-band random vibration and dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 16: Combined bounce or steady-state acceleration, in dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 16: Combined bounce or steady-state acceleration and dry heat or cold
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 17: Combined contamination, solar radiation
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 17: Combined contamination, solar radiation
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 18: Combined damp heat and low internal pressure
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 19: Temperature cycles combined with sinusoidal or random vibration
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 20: Humid atmosphere containing sulfur dioxide or hydrogen sulfide
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 20: Humid atmosphere containing sulfur dioxide or hydrogen sulfide
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental test methods — Part 21: Combined low pressure and ambient temperature or dry heat
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 22: Combined cold, dry heat or temperature change with bump or random vibration
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 23: Low pressure combined with cold, ambient temperature and dry and damp heat
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 23: Low pressure combined with cold, ambient temperature and dry or damp heat
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental test methods — Part 23: Low pressure combined with cold, ambient temperature and dry or damp heat
|
60.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Quality evaluation of optical systems — Determination of distortion
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Quality evaluation of optical systems — Determination of distortion — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Quality evaluation of optical systems — Determination of distortion
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Optical coatings — Part 1: Definitions
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 1: Definitions
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 1: Vocabulary
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 1: Vocabulary
|
60.60 | ISO/TC 172/SC 3 |
Optics and optical instruments — Optical coatings — Part 2: Optical properties
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 2: Optical properties
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 2: Optical properties
|
60.60 | ISO/TC 172/SC 3 |
Optics and optical instruments — Optical coatings — Part 3: Environmental durability
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 3: Environmental durability
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 3: Environmental durability
|
60.60 | ISO/TC 172/SC 3 |
Optics and optical instruments — Optical coatings — Part 4: Specific test methods
|
95.99 | ISO/TC 172/SC 3 |
Optics and optical instruments — Optical coatings — Part 4: Specific test methods
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 4: Specific test methods
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 4: Specific test methods: abrasion, adhesion and resistance to water
|
60.60 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 5: Minimum requirements for antireflecting coatings
|
90.92 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 6: Minimum requirements for reflecting coatings
|
90.92 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 7: Minimum requirements for neutral beam splitter coatings
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 7: Minimum requirements for neutral beam splitter coatings
|
60.60 | ISO/TC 172/SC 3 |
Optics and photonics — Optical coatings — Part 8: Minimum requirements for coatings used for laser optics
|
90.92 | ISO/TC 172/SC 3 |
Optics and optical instruments — Optical transfer function — Application — Part 2: Lenses for office copiers
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Optical transfer function — Application — Part 3: Telescopes
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Optical transfer function — Application — Part 3: Telescopes
|
60.60 | ISO/TC 172/SC 4 |
Optics and optical instruments — Microscopes — Graticules for eyepieces
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Graticules for eyepieces
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Graticules for eyepieces
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Imaging distances related to mechanical reference planes — Part 1: Tube length 160 mm
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Imaging distances related to mechanical reference planes — Part 1: Tube length 160 mm
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes: Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Imaging distances related to mechanical reference planes — Part 2: Infinity-corrected optical systems
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Interfacing dimensions for imaging components
|
90.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Veiling glare of image forming systems — Definitions and methods of measurement
|
90.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental requirements — Part 1: General information, definitions, climatic zones and their parameters
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental requirements — Part 1: General overview, terms and definitions, climatic zones and their parameters
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental requirements — Part 4: Test requirements for telescopic systems
|
95.99 | ISO/TC 172/SC 4 |
Optics and optical instruments — Environmental requirements — Part 6: Test requirements for medical optical devices
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental requirements — Part 6: Test requirements for medical optical instruments
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental requirements — Part 7: Test requirements for optical measuring instruments
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental requirements — Part 8: Test requirements for extreme conditions of use
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Environmental requirements — Part 8: Test requirements for extreme conditions of use
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental requirements — Part 11: Optical instruments for outdoor conditions of use
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Environmental requirements — Part 12: Conditions of transport for optical instruments
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Guidance for the selection of environmental tests
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Guidance for the selection of environmental tests
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Guidance for the selection of environmental tests
|
60.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 1: General
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 1: General
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 1: General
|
90.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 2: Material imperfections — Stress birefringence
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 3: Material imperfections — Bubbles and inclusions
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 4: Material imperfections — Inhomogeneity and striae
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 5: Surface form tolerances
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 5: Surface form tolerances — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 5: Surface form tolerances
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 5: Surface form tolerances
|
90.92 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 6: Centring and tilt tolerances
|
40.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 6: Centring tolerances
|
95.99 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 6: Centring tolerances — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 6: Centring tolerances
|
90.92 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 7: Surface imperfection tolerances
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 7: Surface imperfection tolerances
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 7: Surface imperfections
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 8: Surface texture
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 8: Surface texture; roughness and waviness
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 8: Surface texture
|
90.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 9: Surface treatment and coating
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 9: Surface treatment and coating
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 10: Table representing data of a lens element
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 10: Table representing data of optical elements and cemented assemblies
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 11: Non-toleranced data
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 11: Non-toleranced data — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 11: Non-toleranced data
|
90.92 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 11: Non-toleranced data
|
40.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 12: Aspheric surfaces
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 12: Aspheric surfaces
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 12: Aspheric surfaces — Amendment 1
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 12: Aspheric surfaces
|
90.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 14: Wavefront deformation tolerance
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 14: Wavefront deformation tolerance
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 14: Wavefront deformation tolerance
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 16: Diffractive surfaces
|
60.60 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 17: Laser irradiation damage threshold
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 18: Stress birefringence, bubbles and inclusions, homogeneity, and striae
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Preparation of drawings for optical elements and systems — Part 19: General description of surfaces and components
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Vocabulary for microscopy — Part 1: Light microscopy
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Vocabulary for microscopy — Part 2: Advanced techniques in light microscopy
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Vocabulary for light microscopy
|
90.92 | ISO/TC 172/SC 5 |
Microscopes — Vocabulary for light microscopy
|
40.60 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Interfacing connection type C
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Interfacing connection type C
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Operation microscopes — Part 1: Requirements and test methods
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Operation microscopes — Part 1: Requirements and test methods
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
|
95.99 | ISO/TC 172/SC 7 |
Optics and photonics — Operation microscopes — Part 2: Light hazard from operation microscopes used in ocular surgery
|
90.93 | ISO/TC 172/SC 7 |
Optics and optical instruments — Microscopes — Diameter of interchangeable eyepieces for microscopes with tube length 160 mm
|
95.99 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Diameter of interchangeable eyepieces
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Optical materials and components — Characterization of optical materials used in the infrared spectral range from 0,78 µm to 25 µm
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Characterization of optical materials used in the infrared spectral range from 0,78 µm to 25 µm
|
60.60 | ISO/TC 172/SC 3 |
Optics and optical instruments — Microscopes — Interfacing connection for 35 mm SLR photo cameras (T-thread adaptation)
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Marking of stereomicroscopes
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Minimum requirements for stereomicroscopes — Part 1: Stereomicroscopes for general use
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Minimum requirements for stereomicroscopes — Part 1: Stereomicroscopes for general use
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Minimum requirements for stereomicroscopes — Part 2: High performance microscopes
|
95.99 | ISO/TC 172/SC 5 |
Optics and photonics — Minimum requirements for stereomicroscopes — Part 2: High performance microscopes
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Microscopes — Information provided to the user
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Information provided to the user
|
90.93 | ISO/TC 172/SC 5 |
Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
|
90.92 | ISO/TC 172/SC 9 |
Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
|
50.20 | ISO/TC 172/SC 9 |
Optics and optical instruments — Vocabulary for telescopic systems — Part 1: General terms and alphabetical indexes of terms in ISO 14132
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Vocabulary for telescopic systems — Part 1: General terms and alphabetical indexes of terms in ISO 14132
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Vocabulary for telescopic systems — Part 2: Terms for binoculars, monoculars and spotting scopes
|
95.99 | ISO/TC 172/SC 4 |
Optics and optical instruments — Vocabulary for telescopic systems — Part 2: Terms for binoculars, monoculars and spotting scopes — Technical Corrigendum 1
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Vocabulary for telescopic systems — Part 2: Terms for binoculars, monoculars and spotting scopes
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Vocabulary for telescopic systems — Part 3: Terms for telescopic sights
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Vocabulary for telescopic systems — Part 3: Terms for telescopic sights
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Vocabulary for telescopic systems — Part 3: Terms for telescopic sights
|
60.60 | ISO/TC 172/SC 4 |
Optics and optical instruments — Vocabulary for telescopic systems — Part 4: Terms for astronomical telescopes
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Vocabulary for telescopic systems — Part 4: Terms for astronomical telescopes
|
90.93 | ISO/TC 172/SC 4 |
Optics and photonics — Vocabulary for telescopic systems — Part 5: Terms for night vision devices
|
90.92 | ISO/TC 172/SC 4 |
Optics and optical instruments — Specifications for binoculars, monoculars and spotting scopes — Part 1: General purpose instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for binoculars, monoculars and spotting scopes — Part 1: General purpose instruments
|
90.92 | ISO/TC 172/SC 4 |
Optics and optical instruments — Specifications for binoculars, monoculars and spotting scopes — Part 2: High performance instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for binoculars, monoculars and spotting scopes — Part 2: High performance instruments
|
90.92 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for binoculars, monoculars and spotting scopes - General purpose and high performance instruments
|
40.20 | ISO/TC 172/SC 4 |
Optics and optical instruments — Specifications for astronomical telescopes
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Specifications for telescopic sights — Part 1: General-purpose instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for telescopic sights — Part 1: General-purpose instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for telescopic sights — Part 1: General-purpose instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for telescopic sights — Part 1: General-purpose instruments
|
60.60 | ISO/TC 172/SC 4 |
Optics and optical instruments — Specifications for telescopic sights — Part 2: High-performance instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Specifications for telescopic sights — Part 2: High-performance instruments
|
60.60 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 1: Test methods for basic characteristics
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 2: Test methods for binocular systems
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 3: Test methods for telescopic sights
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 3: Test methods for telescopic sights
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 3: Test methods for telescopic sights
|
60.60 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 4: Test methods for astronomical telescopes
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 5: Test methods for transmittance
|
95.99 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 5: Test methods for transmittance — Amendment 1
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 5: Test methods for transmittance
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 5: Test methods for transmittance
|
60.60 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 6: Test methods for veiling glare index
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 6: Test methods for veiling glare index
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 7: Test methods for limit of resolution
|
95.99 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 7: Test methods for limit of resolution
|
90.93 | ISO/TC 172/SC 4 |
Optics and optical instruments — Test methods for telescopic systems — Part 8: Test methods for night-vision devices
|
90.60 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 9: Test methods for field curvature
|
90.20 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for telescopic systems — Part 10: Test methods for axial colour performance
|
60.60 | ISO/TC 172/SC 4 |
Optics and photonics — Test methods for surface imperfections of optical elements — Part 2: Machine vision
|
60.60 | ISO/TC 172/SC 1 |
Optics and optical instruments — Test methods for surface imperfections of optical elements
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Test methods for surface imperfections of optical elements
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Test methods for surface imperfections of optical elements
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 1: Terms, definitions and fundamental relationships
|
60.60 | ISO/TC 172/SC 1 |
Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 2: Measurement and evaluation techniques
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 2: Measurement and evaluation techniques
|
60.60 | ISO/TC 172/SC 1 |
Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 3: Calibration and validation of interferometric test equipment and measurements
|
60.60 | ISO/TC 172/SC 1 |
Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 4: Interpretation and evaluation of tolerances specified in ISO 10110
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Interferometric measurement of optical elements and optical systems — Part 4: Interpretation and evaluation of tolerances specified in ISO 10110
|
90.92 | ISO/TC 172/SC 1 |
Optics and optical instruments — Microscopes — Testing of stereomicroscopes
|
90.93 | ISO/TC 172/SC 5 |
Optics and optical instruments — Stereomicroscopes — Information provided to the user
|
95.99 | ISO/TC 172/SC 5 |
Stereomicroscopes — Information provided to the user
|
90.60 | ISO/TC 172/SC 5 |
Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
|
95.99 | ISO/TC 202 |
Optics and optical instruments — Quality evaluation of optical systems — Assessing the image quality degradation due to chromatic aberrations
|
90.93 | ISO/TC 172/SC 1 |
Optics and optical instruments — Quality evaluation of optical systems — Assessing the image quality degradation due to chromatic aberrations — Technical Corrigendum 1
|
60.60 | ISO/TC 172/SC 1 |
Microbeam analysis — Analytical electron microscopy — Vocabulary
|
90.60 | ISO/TC 202/SC 1 |
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
|
95.99 | ISO/TC 202/SC 4 |
Microbeam analysis — Scanning electron microscopy — Guidelines for calibrating image magnification
|
90.93 | ISO/TC 202/SC 4 |
Optics and photonics — Wavefront sensors for characterising optical systems and optical components
|
60.60 | ISO/TC 172/SC 1 |
Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials
|
60.60 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Test method for homogeneity of optical glasses by laser interferometry
|
95.99 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Test method for homogeneity of optical glasses by laser interferometry
|
60.60 | ISO/TC 172/SC 3 |
Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
|
90.92 | ISO/TC 172/SC 5 |
Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance
|
40.60 | ISO/TC 172/SC 5 |
Optics and photonics — Designation of microscope objectives — Part 1: Flatness of field/Plan
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Designation of microscope objectives — Part 1: Flatness of field/Plan
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Designation of microscope objectives — Part 1: Flatness of field/Plan
|
90.93 | ISO/TC 172/SC 5 |
Optics and photonics — Designation of microscope objectives — Part 2: Chromatic correction
|
95.99 | ISO/TC 172/SC 5 |
Microscopes — Designation of microscope objectives — Part 2: Chromatic correction
|
90.93 | ISO/TC 172/SC 5 |
Microscopes — Designation of microscope objectives — Part 3: Spectral transmittance
|
90.93 | ISO/TC 172/SC 5 |
Microscopes — Designation of microscope objectives — Part 4: Polarization characteristics
|
60.60 | ISO/TC 172/SC 5 |
Microscopes — Minimum requirements for binocular tubes
|
90.93 | ISO/TC 172/SC 5 |
Microscopes — Definition and measurement of illumination properties — Part 1: Image brightness and uniformity in bright field microscopy
|
90.93 | ISO/TC 172/SC 5 |
Microscopes — Definition and measurement of illumination properties — Part 2: Illumination properties related to the colour in bright field microscopy
|
90.60 | ISO/TC 172/SC 5 |
Microscopes — Definition and measurement of illumination properties — Part 3: Incident light fluorescence microscopy with incoherent light sources
|
60.60 | ISO/TC 172/SC 5 |
Optics and photonics — Optical materials and components — Test method for homogeneity of infrared optical materials
|
90.93 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Test method for striae in infrared optical materials
|
90.92 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Test method for striae in infrared optical materials
|
40.20 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Test method for bubbles and inclusions in infrared optical materials
|
90.93 | ISO/TC 172/SC 3 |
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
90.92 | ISO/TC 202/SC 3 |
Microbeam analysis — Analytical electron microscopy — Method for the determination of interface position in the cross-sectional image of the layered materials
|
50.20 | ISO/TC 202/SC 3 |
Optics and photonics — Spectral bands
|
90.93 | ISO/TC 172 |
Optics and photonics — Environmental requirements — Test requirements for telescopic systems
|
90.93 | ISO/TC 172/SC 4 |
Microscopes — Confocal microscopes — Optical data of fluorescence confocal microscopes for biological imaging
|
90.60 | ISO/TC 172/SC 5 |
Optics and photonics — Telescopic systems — Specifications for night vision devices
|
90.92 | ISO/TC 172/SC 4 |
Microbeam analysis — Scanning electron microscopy — Qualification of the scanning electron microscope for quantitative measurements
|
90.60 | ISO/TC 202/SC 4 |
Optics and photonics — Test method for refractive index of optical glasses — Part 1: Minimum deviation method
|
60.60 | ISO/TC 172/SC 3 |
Optics and photonics — Test method for refractive index of optical glasses — Part 2: V-block refractometer method
|
60.60 | ISO/TC 172/SC 3 |
Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
|
60.60 | ISO/TC 202/SC 4 |
Optics and photonics — Preparation of drawings for optical elements and systems — Surface imperfection specification and measurement systems
|
60.60 | ISO/TC 172/SC 1 |
Optics and photonics — Optical materials and components — The powder test method for the water resistance of optical glass
|
90.92 | ISO/TC 172/SC 3 |
Microbeam analysis — Scanning electron microscopy — Vocabulary
|
95.99 | ISO/TC 202/SC 1 |
Microbeam analysis — Scanning electron microscopy — Vocabulary
|
90.20 | ISO/TC 202/SC 1 |
Optics and photonics — Optical materials and components — Test method for climate resistance of optical glass
|
60.60 | ISO/TC 172/SC 3 |
Optics and photonics — Optical materials and components — Specification of calcium fluoride used in the infrared spectrum
|
60.60 | ISO/TC 172/SC 3 |
Optics and Photonics — Bulk absorption optical filters
|
60.60 | ISO/TC 172/SC 3 |
Optics and photonics — Specification of reference dictionary — Part 1: General overview on organization and structure
|
90.93 | ISO/TC 172 |
Optics and photonics — Specification of reference dictionary — Part 2: Classes' and properties' definitions
|
90.60 | ISO/TC 172 |
Microbeam analysis — Scanning electron microscopy — Methods of evaluating image sharpness
|
90.93 | ISO/TC 202/SC 4 |
Optics and photonics — Electronic exchange of optical data — Part 1: NODIF information model
|
95.99 | ISO/TC 172/SC 1 |
Optics and photonics — Electronic exchange of optical data — Part 1: NODIF information model
|
90.93 | ISO/TC 172/SC 1 |
Optics and photonics — Electronic exchange of optical data — Part 2: Mapping to the classes and properties defined in ISO 23584
|
90.93 | ISO/TC 172/SC 1 |
Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnification by using reference materials having periodic structures
|
95.99 | ISO/TC 202/SC 3 |
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
95.99 | ISO/TC 202/SC 3 |
Microbeam analysis — Analytical electron microscopy — Methods for calibrating image magnification by using reference materials with periodic structures
|
60.60 | ISO/TC 202/SC 3 |
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