ISO 20263:2017
2017-11
Indisponible en français
ISO 20263:2017
Résumé
ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.
Informations générales
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État actuel: PubliéeDate de publication: 2017-11Stade: Norme internationale à réviser [90.92]
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Edition: 1
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Comité technique :ISO/TC 202/SC 3
- RSS mises à jour
Prochaine édition en cours d'élaboration
ISO/DIS 20263
ISO/DIS 20263
Analyse par microfaisceaux — Microscopie électronique analytique — Méthode de détermination de la position d'interface dans l'image de coupe transversale des matériaux en couches
Cycle de vie
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Actuellement
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Sera remplacée par
ProjetISO/DIS 20263
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