Standardization of methods for instrument specification, instrument calibration, instrument operation, data acquisition, data processing, qualitative analysis, and quantitative analysis in the use of secondary ion mass spectrometry, sputtered neutral mass spectrometry, and fast atom bombardment mass spectrometry for surface chemical analysis.

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Published ISO standards *


ISO standards under development *

Participating members
Observing members

* number includes updates

Reference Title Type
ISO/TC 201/SC 6/SG 1   Atom probe tomography Working group
ISO/TC 201/SC 6/SG 2   Mass Spectrometry Imaging Working group
ISO/TC 201/SC 6/WG 4   Organic and Nano SIMS Working group
Liaison Committees to ISO/TC 201/SC 6

The committees below can access the documents of ISO/TC 201/SC 6:

Reference Title ISO/IEC
ISO/TC 229 Nanotechnologies ISO


Organizations in liaison (Category A and B)
Acronym Title Category
IUPAC International Union of Pure and Applied Chemistry A
IUVSTA International Union for Vacuum Science, Technique and Applications A
VAMAS Versailles Project on Advanced Materials and Standards A

Date Month Location TC/SC Note
13 September 2024 La Rochelle (France) ISO/TC 201/SC 6  

* Information definite but meeting not yet formally convened
** Provisional

ISO/TC 201/SC 6 - Secretariat

JISC [Japan]

Japan National Committee for Standardization of Surface Chemical Analysis
#202 Belcom Tsukuba Building
1-2-3 Ninomiya,
Ibaraki 305-0051